About the Tests --------------- The following tests are from the original version, updated simply for speed and rewritten to fit the new framework of the program. These tests will mainly catch memory errors due to bad bits which are permanently stuck high or low: Random value XOR comparison SUB comparison MUL comparison DIV comparison OR comparison AND comparison The following tests were implemented by me, and will do a slightly better job of catching flaky bits, which may or may not hold a true value: Sequential Increment Block Sequential Solid Bits The remaining tests were also implemented by me, and are designed to catch bad bits which are dependent on the current values of surrounding bits in either the same word32, or in the preceding and succeeding word32s. Bit Flip Checkerboard Walking Ones Walking Zeroes Bit Spread There is also a test (Stuck Address) which is run first. It determines if the memory locations the program attempts to access are addressed properly or not. If this test reports errors, there is almost certainly a problem somewhere in the memory subsystem. Results from the rest of the tests cannot be considered accurate if this test fails: Stuck Address Usage information is summarized in the file ABOUT, and in the man page.